ZHCSIZ1G May   2010  – November 2018 LM98640QML-SP

PRODUCTION DATA.  

1. 1 特性
2. 2 應(yīng)用
3. 3 說(shuō)明
4. 4 修訂歷史記錄
5. 5 Pin Configuration and Functions
   1.     Pin Functions
6. 6 Specifications
   1. 6.1 Absolute Maximum Ratings
   2. 6.2 ESD Ratings    
   3. 6.3 Recommended Operating Conditions
   4. 6.4 Thermal Information         
   5. 6.5 Quality Conformance Inspection
   6. 6.6 LM98640QML-SP Electrical Characteristics
   7. 6.7 AC Timing Specifications
   8. 6.8 Typical Performance Characteristics
7. 7 Detailed Description
   1. 7.1 Overview
   2. 7.2 Functional Block Diagram
   3. 7.3 Feature Description
      1. 7.3.1 Input Sampling Modes
         1. 7.3.1.1 Sample & Hold Mode
            1. 7.3.1.1.1 Sample & Hold Mode CLAMP/SAMPLE Adjust
         2. 7.3.1.2 CDS Mode
            1. 7.3.1.2.1 CDS Mode Bimodal Offset
            2. 7.3.1.2.2 CDS Mode CLAMP/SAMPLE Adjust
      2. 7.3.2 Input Bias and Clamping
         1. 7.3.2.1 Sample and Hold Mode Biasing
         2. 7.3.2.2 CDS Mode Biasing
         3. 7.3.2.3 VCLP DAC
      3. 7.3.3 Programmable Gain
         1. 7.3.3.1 CDS/SH Stage Gain
         2. 7.3.3.2 PGA Gain Plots
      4. 7.3.4 Programmable Analog Offset Correction
      5. 7.3.5 Analog to Digital Converter
      6. 7.3.6 LVDS Output
         1. 7.3.6.1 LVDS Output Voltage
         2. 7.3.6.2 LVDS Output Modes
         3. 7.3.6.3 TXFRM Output
            1. 7.3.6.3.1 Output Mode 1 - Dual Lane
            2. 7.3.6.3.2 Output Mode 2 - Quad Lane
      7. 7.3.7 Clock Receiver
      8. 7.3.8 Power Trimming
   4. 7.4 Device Functional Mode
      1. 7.4.1 Powerdown Modes
      2. 7.4.2 LVDS Test Modes
         1. 7.4.2.1 Test Mode 0 - Fixed Pattern
         2. 7.4.2.2 Test Mode 1 - Horizontal Gradient
         3. 7.4.2.3 Test Mode 2 - Vertical Gradient
         4. 7.4.2.4 Test Mode 3 - Lattice Pattern
         5. 7.4.2.5 Test Mode 4 - Stripe Pattern
         6. 7.4.2.6 Test Mode 5 - LVDS Test Pattern (Synchronous)
         7. 7.4.2.7 Test Mode 6 - LVDS Test Pattern (Asynchronous)
         8. 7.4.2.8 Pseudo Random Number Mode
   5. 7.5 Programming
      1. 7.5.1 Serial Interface
      2. 7.5.2 Writing to the Serial Registers
      3. 7.5.3 Reading the Serial Registers
      4. 7.5.4 Serial Interface Timing Details
   6. 7.6 Register Maps
      1. 7.6.1 Register Definitions
8. 8 Application and Implementation
   1. 8.1 Application Information
      1. 8.1.1 Total Ionizing Dose
      2. 8.1.2 Single Event Latch-Up and Functional Interrupt
      3. 8.1.3 Single Event Effects
   2. 8.2 Typical Application
      1. 8.2.1 Sample/Hold Mode
   3. 8.3 Initialization Set Up
9. 9 Layout
   1. 9.1 Layout Guidelines
      1. 9.1.1 Power Planes
      2. 9.1.2 Bypass Capacitors
      3. 9.1.3 Ground Plane
      4. 9.1.4 Thermal Management
10. 10器件和文檔支持
    1. 10.1 器件支持
       1. 10.1.1 開發(fā)支持
          1. 10.1.1.1 評(píng)估板
          2. 10.1.1.2 寄存器編程軟件
    2. 10.2 接收文檔更新通知
    3. 10.3 社區(qū)資源
    4. 10.4 出口管制提示
    5. 10.5 商標(biāo)
    6. 10.6 靜電放電警告
    7. 10.7 術(shù)語(yǔ)表
11. 11機(jī)械、封裝和可訂購(gòu)信息
    1. 11.1 工程樣片