4 Revision History
Changes from Revision C (January 2023) to Revision D (November 2023)
- 根據(jù)最新標(biāo)準(zhǔn)將“特性”中的 ESD 等級(jí)更改為 C3Go
- 將“特性”中的器件溫度等級(jí)從 0 更改為 1Go
Changes from Revision B (March 2020) to Revision C (January 2023)
- 向“特性”中添加了 AEC-Q100 子要點(diǎn)Go
- 向“特性”中添加了安全相關(guān)認(rèn)證Go
- Added what to do with unused pins to pin functions
table.Go
- Changed recommended value of decoupling capacitors. Go
- Added recommended decoupling capacitor layout placement. Go
- Changed
test conditions per DIN EN IEC 60747-17 (VDE
0884-17)
Go
- Changed Ichg lower limit to 430uAGo
- Changed
VAin lower limit to 0.6VGo
- Changed direction of ICLMPI in VCLP-CLMPI test
conditionGo
- Added test condition for soft turn-off currentGo
- Deleted short circuit clamping max conditionGo
- Changed VDE and UL to certifiedGo
- Changed DESAT figureGo
- Changed DESAT soft turn-off figureGo
- Added function state showing gate driver turning on. Changed RDY
condition when VCC is PD. Go
Changes from Revision A (March 2020) to Revision B (March 2020)
- Deleted test voltage, 9600V, from
value columnGo
Changes from Revision * (September 2019) to Revision A (March 2020)
- 將銷(xiāo)售狀態(tài)從“預(yù)告信息”更改為“量產(chǎn)數(shù)據(jù)”。Go