SLVK228 October 2025 TPS7H1121-SEP
- 1
- TPS7H1121-SEP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The TPS7H1121-SEP is packaged in a 24-pin plastic package as shown in Figure 3-1. The TPS7H1121EVM evaluation module was used to evaluate the performance and characteristics of the TPS7H1121-SEP under heavy ion radiation. The TPS7H1121EVM (Evaluation Module) is shown in Figure 3-2. The EVM schematic is shown in Figure 3-3.
![Photograph of Decapped TPS7H1121-SEP [Left] and Pinout Diagram [Right]](/ods/images/SLVK228/GUID-20251001-SS0I-YSV4-V4RL-V7PNKMV2UOHJ-low.jpg "Photograph of Decapped TPS7H1121-SEP [Left] and Pinout Diagram [Right]")
Figure 3-1 Photograph of Decapped TPS7H1121-SEP [Left] and Pinout Diagram [Right]Note: The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-2 TPS7H1121-SEP EVM Top View