Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TPS7H1121-SEP. Heavy-ions with LET_EFF of 48 MeV·cm²/mg were used to irradiate 12 total devices. Flux of 8.78 × 10⁴ to 1.60 × 10⁵ ions/cm²/s and fluence of ≈10⁷ ions/cm² per run were used for the characterization. The results demonstrated that the TPS7H1121-SEP is SEL-free up to 48 MeV·cm²/mg at T = 125°C and SEB/SEGR free up to 48 MeV·cm²/mg at T = 25°C. Output signals including V_OUT (3% window), PG (edge trigger at 50% below nominal), and SS (edge trigger at 50% below nominal) were monitored to check for transients and or SEFIs. The device showed to be SET and SEFI free up to 48 MeV·cm²/mg at T = 25°C.