SLVK228 October 2025 TPS7H1121-SEP
- 1
- TPS7H1121-SEP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
7.1 Single-Event Latch-up (SEL) Results
During the SEL characterization, the device was heated using the load (0.6V case) or with external heat (13.3V case). When using external heat, the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The temperature of the die was constantly monitored during testing at TAMU through an IR camera integrated into the control loop to create closed-loop temperature control, while at KSEE, a standalone FLIR thermal camera was used to verify temperature prior to exposure.
The species used for SEL testing was Silver (109Ag at 15 MeV/nucleon and 19.5 MeV/nucleon at TAMU and KSEE, respectively). For both ions an incident angle of 0° was used to achieve an LETEFF = 48MeV·cm2/mg (for more details refer to Table 5-1). The kinetic energy in the vacuum for 109Ag is 1.633 GeV and 2.123 GeV for TAMU and KSEE, respectively. A flux of 9.51 × 104 to 1.46 × 105 ions/cm2/s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately 2 minutes. The nine units were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V. No SEL events were observed during all nine runs, indicating that the TPS7H1121-SEP is SEL-free up to 48 MeV·cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 and Figure 7-2 show plots of the current vs time for runs #1 and #3.
| Run Number | Unit Number | Facility | ION | LETEFF (MeV·cm2/mg) | FLUX (ions/cm2 /s) | FLUENCE (ions/cm2) | VOUT (V) | IOUT (A) | SEL (Number of Events) |
|---|---|---|---|---|---|---|---|---|---|
| 1 | 1 | TAMU | 109Ag | 47.7 | 1.31 × 105 | 1 × 107 | 13.3 | 2 | 0 |
| 2 | 2 | TAMU | 109Ag | 47.7 | 1.46 × 105 | 1 × 107 | 13.3 | 2 | 0 |
| 3 | 3 | TAMU | 109Ag | 47.7 | 1.19 × 105 | 1 × 107 | 0.6 | 0.485 | 0 |
4 | 4 | TAMU | 109Ag | 47.7 | 9.68 × 104 | 1 × 107 | 13.3 | 2 | 0 |
5 | 5 | TAMU | 109Ag | 47.7 | 1.31 × 105 | 1 × 107 | 0.6 | 0.311 | 0 |
6 | 6 | TAMU | 109Ag | 47.7 | 1.27 × 105 | 1 × 107 | 0.6 | 0.6 | 0 |
7 | 7 | TAMU | 109Ag | 47.7 | 1.23 × 105 | 1 × 107 | 13.3 | 2 | 0 |
8 | 8 | KSEE | 109Ag | 48 | 9.53 × 104 | 1 × 107 | 0.6 | 0.2 | 0 |
9 | 9 | KSEE | 109Ag | 48 | 9.51 × 104 | 1 × 107 | 13.3 | 2 | 0 |
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the nine runs at 125°C (9 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEL ≤ 4.10 x 10-8 cm2/device for LETEFF = 48 MeV·cm2/mg and T = 125°C.
Figure 7-1 SEL Current Versus Time for Run #1 of the TPS7H1121-SEP at T = 125°C (VOUT = 13.3V)
Figure 7-2 SEL Current Versus Time for Run #3 of the TPS7H1121-SEP at T = 125°C (VOUT = 0.6V)