SLVK262 February 2026 TPS7H5030-SEP
- 1
- 2
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The TPS7H5030-SEP is packaged in a 24-pin HTSSOP PWP plastic package as shown in Figure 3-1. A custom TPS7H5030-SEP evaluation module, designed for open-loop SEE testing was used to evaluate the performance and characteristics of the TPS7H5030-SEP under heavy ion radiation. The evaluation module is shown in Figure 3-2. The schematics are shown in Figure 3-2 and Figure 3-4.
![Photograph of Delidded TPS7H5030-SEP [Left] and Pinout Diagram [Right]](/ods/images/SLVK262/GUID-20260205-SS0I-6J0Y-VCBQ-NTTPXEZ30JIV-low.svg "Photograph of Delidded TPS7H5030-SEP [Left] and Pinout Diagram [Right]")
Figure 3-1 Photograph of Delidded TPS7H5030-SEP [Left] and Pinout Diagram [Right]Note: The package was delidded/decapped to reveal the die face for all heavy-ion testing.
Figure 3-2 TPS7H5030-SEP Custom EVM Top View
Figure 3-3 TPS7H5030-SEP Custom EVM Schematics
Figure 3-4 TPS7H5030-SEP Custom EVM Auxiliary Schematic