7 Summary

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the SN54SC1G175-SEP radiation-tolerant, Single D-Type Flip-Flop With Asynchronous Clear. SEE performance was verified at minimum (1.1V) and maximum (5.5V) operating conditions. Heavy-ions with an LET_EFF of 50MeV-cm²/ mg were used to irradiate three production devices with a fluence of 1 × 10⁷ ions / cm². The results demonstrate that the SN54SC1G175-SEP is SEL-free up to LET_EFF = 50MeV-cm²/ mg as 125°C. SET performance for the minimum and maximum operating voltage saw no excursions ≥ |2%|, as shown and discussed in this report.