SLVK281 February 2026 SN54SC1G175-SEP
SETs are defined as heavy-ion-induced transient upsets on output pin Q of the SN54SC1G175-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was 129Xe for a LETEFF = 50MeV × cm2 / mg. Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 were used for the SET runs.
One unit was tested across multiple input conditions to determine the worst-case setup for SETs. The unit was tested with VCC of 5.5V and VCC of 1.1V . All combinations of VCC and scope trigger configurations showed no transient upsets, as listed in Table 5-2.
To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin Q. The scope monitoring the square wave output signal was configured to a rising edge window pulse trigger of ±2%. The NI scopes were programmed to a sample rate of 100M samples per second (S/s) and recorded 1000 samples, with a 2% pretrigger reference, in case of an event (trigger). The setup was verified for each run to ensure no false triggers was captured before the beam was turned on. The ±2% threshold on the square wave outputs was determined to be the lowest threshold capable of not providing false triggers due to noise.
Under heavy-ions, the SN54SC1G175-SEP did not exhibit any transient upsets.
| Run Number | Unit Number | Voltage Level | Temperature (°C) | Ion | LETEFF (MeV × cm2/mg) | FLUX (ions × cm2/ mg) | Fluence (Number ions) | Window Trigger | SET Upsets |
|---|---|---|---|---|---|---|---|---|---|
| 10 | 2 | 5.5V | 25 | Xe | 50 | 1.00E+05 | 1.00E+07 | 2% | 0 |
| 11 | 2 | 1.1V | 25 | Xe | 50 | 1.00E+05 | 1.00E+07 | 2% | 0 |
Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations, the upper-bound cross-section (using a 95% confidence level) is calculated as: